A BIST Technique for Sigma-Delta Modulators Based on Circuit Recon guration

Sigma-Delta ( ) modulation has become a popular technique for achieving high resolution in modern A/D and D/A converters. On-chip test techniques for this type of circuits have been made available recently in the literature. These techniques are based on measuring parameters such as signal-to-noise ratio (SNR) and harmonic and intermodulation distortion. However, they require considerable on-chip digital signal processing capabilities for computing these measures. In this work, we present a BIST technique for modulators based on circuit recon guration and comparison. We illustrate the approach for the case of a double-loop band-pass modulator which is made self-testable by adding some simple circuitry and logic to control the tests.